The tariff classification of the Caliper 3oomm Overlay Measurement Tool from the United Kingdom
Issued March 26, 2002 by U.S. Customs and Border Protection.
Tariff classification
HTS codes: 9031.41.0040
Headings: 9031
Product description
The Caliper 300mm Overlay Measurement Tool (Caliper) is used in the measurement of processing errors that may occur in the manufacture of semiconductor products. The Caliper’s primary application is for monitoring layer-to-layer registration errors. Its secondary function is the measurement of critical dimensions. A computer controlled wafer handler is used to transfer wafers and load them to the wafer stage. Observation of the wafer is accomplished by an imaging system that provides a video image of the wafer. Automatic recognition is used to align the wafer and find the measurement targets. The optics module contains measurement lenses and provides magnification through a five-position objective lens changer. The light source is a 150-watt short arc xenon lamp.
CBP rationale
The applicable subheading for the Caliper will be 9031.41.0040, Harmonized Tariff Schedule of the United States (HTS), which provides for other optical instruments and appliances; for inspecting semiconductor wafers or devices; for wafers.
Full text
NY H89484 March 26, 2002 CLA-2-90:RR:NC:MM:114 H89484 CATEGORY: Classification TARIFF NO.: 9031.41.0040 Mr. Gordon Van Sise Kamino International Transport, Inc. Airport Industrial Office Park Bldg. B4A 145th Avenue at Hook Creek Blvd. Valley Stream, New York 11581 RE: The tariff classification of the Caliper 3oomm Overlay Measurement Tool from the United Kingdom Dear Mr. Van Sise: In your letter dated March 5, 2002, on behalf of Accent Optical Technologies, Inc., you requested a tariff classification ruling. The Caliper 300mm Overlay Measurement Tool (Caliper) is used in the measurement of processing errors that may occur in the manufacture of semiconductor products. The Caliper’s primary application is for monitoring layer-to-layer registration errors. Its secondary function is the measurement of critical dimensions. A computer controlled wafer handler is used to transfer wafers and load them to the wafer stage. Observation of the wafer is accomplished by an imaging system that provides a video image of the wafer. Automatic recognition is used to align the wafer and find the measurement targets. The optics module contains measurement lenses and provides magnification through a five-position objective lens changer. The light source is a 150-watt short arc xenon lamp. The applicable subheading for the Caliper will be 9031.41.0040, Harmonized Tariff Schedule of the United States (HTS), which provides for other optical instruments and appliances; for inspecting semiconductor wafers or devices; for wafers. The rate of duty will be free. This ruling is being issued under the provisions of Part 177 of the Customs Regulations (19 C.F.R. 177). A copy of the ruling or the control number indicated above should be provided with the entry documents filed at the time this merchandise is imported. If you have any questions regarding the ruling, contact National Import Specialist Barbara Kiefer at 646-733-3019. Sincerely, Robert B. Swierupski Director, National Commodity Specialist Division
More rulings on the same tariff codes
The tariff classification of a metrology and inspection machine from Israel
The tariff classification of wafer loaders from Japan
The tariff classification of Wafer Auto Loaders from Japan
The tariff classification of Nidek Flatness Tester Model FT-11, Nidek Flatness Tester Model FT-12, Nidek Flatness Tester Model FT-3D, Nidek Flatness Tester Model FT-900 and Himec Wafer Cassette Inspection Machine Model CA-008A from Japan
The tariff classification of a Laser Electro Optics Edge (LEO) Profile Monitor Model LEP-820, Laser Electro Optics Edge Profile Monitor Model LEP-810, Laser Electro Optics Semiconductor Wafer Lifetime Measurement System Model LTA-1000EP and Laser Electro Optics Semiconductor Wafer Lifetime Measurement System Model LTA-1200EP from Japan
The tariff classification of Nikon Optistations from Japan.
The tariff classification of a Deep Level Transient Spectrometer and a Lifetime Scanner from Hungary
The tariff classification of the WT-85 Lifetime Scanner from Hungary
Searching CBP rulings the smart way
TariffLens semantically searches all 200,000+ CBP rulings, surfaces the ones that actually match your product, and builds defensible classifications backed by ruling citations.
Book a demo →